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相变锗锑纳米线:合成、记忆开关及相不稳定性

Phase-change Ge-Sb nanowires: synthesis, memory switching, and phase-instability.

作者信息

Jung Yeonwoong, Yang Chung-Ying, Lee Se-Ho, Agarwal Ritesh

机构信息

Department of Materials Science and Engineering, University of Pennsylvania, Philadelphia, Pennsylvania 19104, USA.

出版信息

Nano Lett. 2009 May;9(5):2103-8. doi: 10.1021/nl900620n.

Abstract

We report the synthesis and characterization of phase-change Ge-Sb nanowires with two different eutectic compositions and their memory switching characteristics. Under application of electric-fields with controlled pulse amplitude and duration times, Sb-rich (Sb > or = 86 at. %) eutectic Ge-Sb nanowires show phase-change based memory switching, while another eutectic GeSb (Ge:Sb = 1:1) nanowires do not show electronic memory switching at all. However, under repeated measurements, Sb-rich Ge-Sb nanowires display an increase of resistance of the low resistive state. The observed electrical irreversibility for Sb-rich Ge-Sb nanowires is attributed to the structural and compositional instability due to the phase-separation of Ge out of homogeneous Ge-Sb as observed from rapid thermal annealing and transmission electron microscopy experiments. Implications for design of Te-free nanoscale materials for phase change memory applications are also discussed.

摘要

我们报道了具有两种不同共晶成分的相变锗锑纳米线的合成与表征及其记忆开关特性。在施加具有可控脉冲幅度和持续时间的电场时,富锑(锑≥86原子百分比)共晶锗锑纳米线表现出基于相变的记忆开关,而另一种共晶锗锑(锗:锑 = 1:1)纳米线根本不显示电子记忆开关。然而,在重复测量下,富锑锗锑纳米线显示出低电阻态电阻的增加。观察到的富锑锗锑纳米线的电不可逆性归因于从快速热退火和透射电子显微镜实验中观察到的由于锗从均匀的锗锑中相分离而导致的结构和成分不稳定性。还讨论了对用于相变存储器应用的无碲纳米级材料设计的启示。

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