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使用Amplatzer房间隔封堵器成功经导管封堵房间隔缺损的相关因素。

Factors related to successful transcatheter closure of atrial septal defects using the Amplatzer septal occluder.

作者信息

Rastogi Namrata, Smeeton Nigel Charles, Qureshi Shakeel Ahmed

机构信息

Department of Congenital Heart Disease, Evelina Children's Hospital, Guy's & Thomas' NHS Foundation Trust, London SE1 7EH, UK.

出版信息

Pediatr Cardiol. 2009 Oct;30(7):888-92. doi: 10.1007/s00246-009-9452-z. Epub 2009 May 30.

Abstract

The Amplatzer septal occluder (ASO) is used for transcatheter closure of atrial septal defects (ASDs). This study aimed to determine the factors influencing successful closure with the ASO. A retrospective analysis of 69 patients who underwent transcatheter ASD occlusion between 2003 and 2007 was performed. The ASO was successfully implanted during 67 (97%) of 69 procedures. A major adverse event occurred for 6 patients (9%), and 13 patients (19%) experienced a minor adverse event. The outcome for 53 cases (77%) was a composite clinical success. Patient age (p = 0.191) and consultant experience (p = 0.270) were not important factors in successful ASD occlusion. However, patient weight (p = 0.031), diameter of the defect (p = 0.030), device size (p = 0.044), aortic rim size (p = 0.002), and device/defect ratio (p < 0.001) all were significant factors. Complications were significantly more likely for patients whose device/defect ratio was <1.125 (loose) or > or = 1.333 (tight) (p < 0.001). The device/defect ratio may provide a clinically useful tool with the potential to predict patients likely to experience an adverse event as a result of transcatheter ASD occlusion. A larger sample would enable refinement of the device/defect ratio and provide a more robust prediction of success.

摘要

Amplatzer房间隔封堵器(ASO)用于经导管闭合房间隔缺损(ASD)。本研究旨在确定影响ASO成功封堵的因素。对2003年至2007年间接受经导管ASD封堵的69例患者进行了回顾性分析。69例手术中有67例(97%)成功植入了ASO。6例患者(9%)发生了严重不良事件,13例患者(19%)经历了轻微不良事件。53例(77%)的结果为综合临床成功。患者年龄(p = 0.191)和术者经验(p = 0.270)不是ASD封堵成功的重要因素。然而,患者体重(p = 0.031)、缺损直径(p = 0.030)、封堵器尺寸(p = 0.044)、主动脉缘尺寸(p = 0.002)以及封堵器/缺损比值(p < 0.001)均为显著因素。封堵器/缺损比值<1.125(宽松)或>或 = 1.333(紧密)的患者发生并发症的可能性显著更高(p < 0.001)。封堵器/缺损比值可能提供一种临床上有用的工具,有潜力预测因经导管ASD封堵而可能发生不良事件的患者。更大的样本量将能够优化封堵器/缺损比值,并提供更可靠的成功预测。

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