Department of Applied Physics, Institute of Optoelectronics and Solid State Electronics, National Chiayi University, Taiwan, Republic of China.
Microsc Res Tech. 2010 Jan;73(1):1-4. doi: 10.1002/jemt.20745.
This work investigates recording bits on recordable and rewritable blu-ray discs using atomic force microscopy and conducting atomic force microscopy with high contrast, respectively. The geometric structure of the recording bits is clearly observed in images, which, when coupled with cross-section analysis, yields precise bit dimensions, and edge horizontal extended length values. The microscopic results are a valuable reference for increasing the recognition rate of digital signals in optical storage media. Furthermore, such a rapid and convenient measuring mode is an indispensable research tool for developing new recording materials and improving formation mechanisms.
本工作分别使用原子力显微镜和具有高对比度的导电原子力显微镜研究了可记录和可重写蓝光光盘上的记录位。在图像中清晰地观察到记录位的几何结构，结合截面分析，得到了精确的位尺寸和边缘水平扩展长度值。微观结果为提高光存储介质中数字信号的识别率提供了有价值的参考。此外，这种快速便捷的测量模式是开发新型记录材料和改进形成机制不可或缺的研究工具。
