一种用于直接测量覆盖有分子级薄液膜的纳米结构表面表面能的简单原子力显微镜校准方法。

A simple atomic force microscopy calibration method for direct measurement of surface energy on nanostructured surfaces covered with molecularly thin liquid films.

作者信息

Brunner Ralf, Etsion Izhak, Talke Frank E

机构信息

University of California San Diego, La Jolla, California 92093-0401, USA.

出版信息

Rev Sci Instrum. 2009 May;80(5):055109. doi: 10.1063/1.3136908.

DOI:10.1063/1.3136908

PMID:19485536

Abstract

A simple calibration method is described for the determination of surface energy by atomic force microscopy (AFM) pull-off force measurements on nanostructured surfaces covered with molecularly thin liquid films. The method is based on correlating pull-off forces measured in arbitrary units on a nanostructured surface with pull-off forces measured on macroscopically smooth dip-coated gauge surfaces with known surface energy. The method avoids the need for complex calibration of the AFM cantilever stiffness and the determination of the radius of curvature of the AFM tip. Both of the latter measurements are associated with indirect and less accurate measurements of surface energy based on various contact mechanics adhesion models.

摘要

描述了一种简单的校准方法，用于通过原子力显微镜（AFM）对覆盖有分子薄液膜的纳米结构表面进行拉脱力测量来测定表面能。该方法基于将在纳米结构表面上以任意单位测量的拉脱力与在具有已知表面能的宏观光滑浸涂标准表面上测量的拉脱力相关联。该方法避免了对AFM悬臂梁刚度进行复杂校准以及确定AFM针尖曲率半径的需要。后两种测量都与基于各种接触力学粘附模型对表面能进行的间接且不太准确的测量相关。