Girard Christian, Quidant Romain
Opt Express. 2004 Dec 13;12(25):6141-6. doi: 10.1364/opex.12.006141.
A self-consistent model based on the classical fieldsusceptibilities formalism has been developed to simulate recent experiments where metallic particle chain waveguides are addressed locally by the tip of a Scanning Near-Field Optical Microscope (SNOM) [1]. This approach which accounts for the actual optical response of the particles leads to a reliable description of both near-field transmittances and losses of this kind of integrated devices.
基于经典场敏感性形式主义开发了一种自洽模型,用于模拟近期的实验,这些实验中金属粒子链波导由扫描近场光学显微镜(SNOM)的尖端进行局部寻址[1]。这种考虑粒子实际光学响应的方法能够可靠地描述此类集成器件的近场透射率和损耗。