Gerace Dario, Andreani Lucio
Opt Express. 2005 Jun 27;13(13):4939-51. doi: 10.1364/opex.13.004939.
We study disorder-induced propagation losses of guided modes in photonic crystal slabs with line-defects. These losses are treated within a theoretical model of size disorder for the etched holes in the otherwise periodic photonic lattice. Comparisons are provided with state-of-the-art experimental data, both in membrane and Silicon-on-Insulator (SOI) structures, in which propagation losses are mainly attributed to fabrication imperfections. The dependence of the losses on the photon group velocity and the useful bandwidth for low-loss propagation are analyzed and discussed for membrane and asymmetric as well as symmetric SOI systems. New designs for further improving device performances are proposed, which employ waveguides with varying channel widths. It is shown that losses in photonic crystal waveguides could be reduced by almost an order of magnitude with respect to latest experimental results. Propagation losses lower than 0.1 dB/mm are predicted for suitably designed structures, by assuming state-of-the-art fabrication accuracy.
我们研究了具有线缺陷的光子晶体平板中无序诱导的导模传播损耗。这些损耗在光子晶格中蚀刻孔的尺寸无序理论模型中进行处理,该光子晶格在其他方面是周期性的。我们将其与最先进的实验数据进行了比较,这些实验数据来自薄膜和绝缘体上硅(SOI)结构,其中传播损耗主要归因于制造缺陷。分析并讨论了损耗对光子群速度的依赖性以及低损耗传播的可用带宽,涉及薄膜、非对称和对称SOI系统。提出了进一步提高器件性能的新设计,该设计采用具有变化通道宽度的波导。结果表明,相对于最新实验结果,光子晶体波导中的损耗可降低近一个数量级。通过假设最先进的制造精度,对于适当设计的结构,预测传播损耗低于0.1 dB/mm。