Wang Wei, Yokozeki Tomoaki, Ishijima Reika, Wada Atsushi, Miyamoto Yoko, Takeda Mitsuo, Hanson Steen G
Opt Express. 2006 Jan 9;14(1):120-7. doi: 10.1364/opex.14.000120.
As an alternative to correlation-based techniques widely used in conventional speckle metrology, we propose a new technique that makes use of phase singularities in the complex analytic signal of a speckle pattern as indicators of local speckle displacements. The complex analytic signal is generated by vortex filtering the speckle pattern. Experimental results are presented that demonstrate the validity and the performance of the proposed optical vortex metrology with nano-scale resolution.
作为传统散斑计量学中广泛使用的基于相关性技术的替代方法，我们提出了一种新技术，该技术利用散斑图案复解析信号中的相位奇点作为局部散斑位移的指标。复解析信号是通过对散斑图案进行涡旋滤波生成的。给出的实验结果证明了所提出的具有纳米级分辨率的光学涡旋计量学的有效性和性能。
