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低锗浓度纳米结构硅中纳米晶粒和点缺陷导致的声子散射增加。

Increased phonon scattering by nanograins and point defects in nanostructured silicon with a low concentration of germanium.

作者信息

Zhu G H, Lee H, Lan Y C, Wang X W, Joshi G, Wang D Z, Yang J, Vashaee D, Guilbert H, Pillitteri A, Dresselhaus M S, Chen G, Ren Z F

机构信息

Department of Physics, Boston College, Chestnut Hill, Massachusetts 02467, USA.

出版信息

Phys Rev Lett. 2009 May 15;102(19):196803. doi: 10.1103/PhysRevLett.102.196803. Epub 2009 May 14.

Abstract

The mechanism for phonon scattering by nanostructures and by point defects in nanostructured silicon (Si) and the silicon germanium (Ge) alloy and their thermoelectric properties are investigated. We found that the thermal conductivity is reduced by a factor of 10 in nanostructured Si in comparison with bulk crystalline Si. However, nanosize interfaces are not as effective as point defects in scattering phonons with wavelengths shorter than 1 nm. We further found that a 5 at. % Ge replacing Si is very efficient in scattering phonons shorter than 1 nm, resulting in a further thermal conductivity reduction by a factor of 2, thereby leading to a thermoelectric figure of merit 0.95 for Si95Ge5, similar to that of large grained Si80Ge20 alloys.

摘要

研究了纳米结构以及纳米结构硅(Si)和硅锗(Ge)合金中的点缺陷对声子散射的机制及其热电性能。我们发现,与块状晶体硅相比,纳米结构硅的热导率降低了10倍。然而,纳米尺寸的界面在散射波长小于1nm的声子时不如点缺陷有效。我们进一步发现,用5原子百分比的Ge替代Si在散射波长小于1nm的声子时非常有效,导致热导率进一步降低2倍,从而使Si95Ge5的热电优值达到0.95,与大晶粒Si80Ge20合金的热电优值相似。

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