Zhou Ping, Burge James H
Opt Express. 2007 Nov 12;15(23):15410-7. doi: 10.1364/oe.15.015410.
Aspheric optical surfaces are often tested using computer-generated holograms (CGHs). The etching of the CGH pattern must be highly accurate to create desired wavefronts. Variations of line width, etching depth, and surface roughness cause unwanted wavefront errors. The sensitivity to these manufacturing errors is studied using scalar diffraction analysis. We provide a parametric model that can be used for optimizing the CGH design to give good diffraction efficiency and limited sensitivity to manufacturing errors.
非球面光学表面通常使用计算机生成全息图(CGH)进行测试。CGH图案的蚀刻必须高度精确,以产生所需的波前。线宽、蚀刻深度和表面粗糙度的变化会导致不必要的波前误差。使用标量衍射分析研究了对这些制造误差的敏感性。我们提供了一个参数模型,可用于优化CGH设计,以获得良好的衍射效率并降低对制造误差的敏感性。