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高达300千伏的X射线光谱及散射分量的测定。

Determination of x-ray spectra and of the scattered component up to 300 kV.

作者信息

Laitano R F, Pani R, Pellegrini R

机构信息

ENEA, CRE Casaccia, Dipartimento AMB-BIO, Rome, Italy.

出版信息

Med Phys. 1991 Sep-Oct;18(5):934-8. doi: 10.1118/1.596742.

DOI:10.1118/1.596742
PMID:1961157
Abstract

Several x-ray spectra, including those of the ISO reference radiations, were measured by 2-hp Ge detectors. Measurements were carried out in different experimental conditions with regard to detector size, beam collimation, and SDD. A stripping procedure to improve the spectrum analysis was developed on the basis of a detailed evaluation (by means of a Monte Carlo method) of the detector's spurious effects. These effects include K-photon escape, Compton photon escape, electron escape, and collimation effect. The stripping procedure also allows us to determine directly the spectra of possible scattered radiation reaching the detector in addition to the primary beam. When the primary beam is heavily filtered, the leakage radiation from the x-ray tube housing scattered onto the detector may not be negligible even when the x-ray tube is provided with appreciable shielding. Possible practical consequence of these effects are discussed. The results obtained on the ISO x-ray spectra are in agreement with previous determinations. The advantage of the present procedure is its more immediate applicability to Ge detectors of any size and with different beam collimation conditions.

摘要

使用2马力的锗探测器测量了包括ISO参考辐射在内的多个X射线光谱。针对探测器尺寸、光束准直和源到探测器距离(SDD),在不同实验条件下进行了测量。基于对探测器杂散效应的详细评估(通过蒙特卡罗方法),开发了一种用于改进光谱分析的剥离程序。这些效应包括K光子逃逸、康普顿光子逃逸、电子逃逸和准直效应。剥离程序还使我们能够直接确定除初级光束外到达探测器的可能散射辐射的光谱。当初级光束经过大量过滤时,即使X射线管配备了可观的屏蔽,从X射线管外壳散射到探测器上的泄漏辐射也可能不可忽略。讨论了这些效应可能产生的实际后果。在ISO X射线光谱上获得的结果与先前的测定结果一致。本程序的优点是它更直接适用于任何尺寸且具有不同光束准直条件的锗探测器。

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