Pani R, Laitano R F, Pellegrini R
Dipartimento di Medicinia, Sperimentale-Università La Sapienza, Roma, Italy.
Phys Med Biol. 1987 Sep;32(9):1135-49. doi: 10.1088/0031-9155/32/9/007.
A silicon surface barrier detector is used to analyse diagnostic x-ray spectra. This detector, usually employed to detect charged particles, has a very low efficiency for x-ray. This characteristic is advantageous in overcoming experimental problems caused by the high fluence rates typical of diagnostic x-ray beams. The pulse height distribution obtained with silicon surface barrier detectors is very different from the true photon spectra because of the presence of escaped Compton photons and the fact that detection efficiency falls abruptly when photon energy increases. A detailed analysis of the spurious effects involved in detection is made by applying a Monte Carlo method. A stripping procedure is described for implementation on a personal computer. The validity of this method is finally tested by comparison with the experimental results obtained with a Ge detector. The spectra obtained with the Si detector are in fairly good agreement with the analogous spectra measured with a Ge detector. The advantages of using Si as opposed to Ge detectors in x-ray spectrometry can be summarised as: its simplicity of use, its greater economy for use in routine diagnostic x-ray spectroscopy and the possibility that the stripping procedure can be implemented on a personal computer.
硅面垒探测器用于分析诊断用X射线光谱。这种探测器通常用于探测带电粒子，对X射线的探测效率很低。这一特性有利于克服诊断用X射线束典型的高通量率所引起的实验问题。由于存在逃逸的康普顿光子以及光子能量增加时探测效率会突然下降，用硅面垒探测器获得的脉冲高度分布与真实的光子光谱有很大不同。通过应用蒙特卡罗方法对探测中涉及的虚假效应进行了详细分析。描述了一种在个人计算机上实施的剥离程序。最后通过与用锗探测器获得的实验结果进行比较来检验该方法的有效性。用硅探测器获得的光谱与用锗探测器测量的类似光谱相当吻合。在X射线光谱分析中使用硅探测器相对于锗探测器的优点可概括为：使用简单、在常规诊断X射线光谱学中使用成本更低，以及剥离程序可在个人计算机上实施。
