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集成在芯片上的金属电极的断裂机制及聚对苯二甲酸乙二酯电泳微芯片的制造

Fracture mechanism of metal electrode integrated on a chip and fabrication of a poly(ethylene terephthalate) electrophoresis microchip.

作者信息

Liu Chong, Li Jing-Min, Liu Jun-Shan, Wang Li-Ding, Hao Zhen-Xia, Chen Heng-Wu

机构信息

Key Laboratory for Micro/Nano Technology and System of Liaoning Province, Dalian University of Technology, Dalian, China.

出版信息

Talanta. 2009 Oct 15;79(5):1341-7. doi: 10.1016/j.talanta.2009.05.048. Epub 2009 Jun 9.

Abstract

Thermal bonding is an important technique to fabricate polymer electrophoresis microchip. However, the metal electrodes deposited on polymer substrate can readily fracture during the thermal bonding. In this paper, poly(ethylene terephthalate) (PET) was exploited to fabricate the electrophoresis microchip with an integrated gold electrode for amperometric detection. The fracture of the gold electrode was studied through FEA (finite element analysis) simulations, the potentially risk positions on the electrode were shown. The calculation results were tested by bonding experiments and were proven to be consistent with the experiments. Besides, an optimal bonding temperature for PET chip was also presented based on FEA simulations and bonding experiments. Considering the low surface properties of PET, oxygen plasma-assisted thermal bonding technique was used to enhance bonding. Upon treated for 150 s, the PET substrates could be thermally bonded at 62 degrees C without electrode fracture. The fabricated PET chips were demonstrated for detection of standard glucose solution. Satisfactory reproducibility was achieved, and the RSD values of peak height and migration time of the PET CE chips were 0.51% and 2.17%, respectively.

摘要

热键合是制造聚合物电泳微芯片的一项重要技术。然而,沉积在聚合物基底上的金属电极在热键合过程中很容易断裂。在本文中,聚对苯二甲酸乙二酯(PET)被用于制造带有集成金电极用于安培检测的电泳微芯片。通过有限元分析(FEA)模拟研究了金电极的断裂情况,显示了电极上潜在的风险位置。计算结果通过键合实验进行了验证,结果证明与实验一致。此外,基于FEA模拟和键合实验,还给出了PET芯片的最佳键合温度。考虑到PET的低表面性能,采用氧等离子体辅助热键合技术来增强键合效果。处理150秒后,PET基底可以在62摄氏度下进行热键合而不会导致电极断裂。所制造的PET芯片用于检测标准葡萄糖溶液。实现了令人满意的重现性,PET毛细管电泳芯片峰高和迁移时间的相对标准偏差(RSD)值分别为0.51%和2.17%。

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