Bell B W, Koliopoulos C L
Opt Lett. 1984 May 1;9(5):171-3. doi: 10.1364/ol.9.000171.
Projection-type moiré contouring can be done without a reference grid by undersampling projected cosine fringes with a charged-coupled-device detector array to eliminate entirely the unwanted sum, shadow, and grid terms of classical moiré methods as well as the spurious moiré fringes that are due to higher harmonics. The technique produces a high-visibility sampled version of the moiré difference contour fringes. Higher-order aliasing can provide increased sensitivity when the same detector array is used. The sampling conditions are formulated as a moiré extension to the Whittaker-Shannon sampling theorem.
通过使用电荷耦合器件探测器阵列对投影的余弦条纹进行欠采样,无需参考网格即可进行投影型莫尔轮廓测量,从而完全消除经典莫尔方法中不需要的和项、阴影项和网格项,以及由高次谐波引起的虚假莫尔条纹。该技术产生了莫尔差轮廓条纹的高可见度采样版本。当使用相同的探测器阵列时,高阶混叠可以提供更高的灵敏度。采样条件被表述为对惠特克 - 香农采样定理的莫尔扩展。