Li Fei, Jin Li, Xu Zhuo, Guo Zhenqi
Electronic Materials Research Laboratory, Xi'an Jiaotong University, Xi'an 710049, People's Republic of China.
Rev Sci Instrum. 2009 Aug;80(8):085106. doi: 10.1063/1.3204781.
X-ray diffraction (XRD) techniques are widely used in determining crystallographic orientations. In this paper we describe a two-step method to determine the three-dimensional orientations of ferroelectric single crystals based on an improved rotating orientations XRD method. This method could be readily carried out on standard x-ray laboratory equipment. Taking into account the geometric relationship in crystallography, we obtain an equation to find the expected crystallographic plane and simplify the determining process. The application of this method to LiNbO(3) and xPb(Mg(1/3)Nb(2/3))O(3)-(1-x)PbTiO(3) ferroelectric single crystals demonstrates that it is a fast, flexible, and waste-free method for crystallographic orientation. Explanations of the scanning diffraction patterns and evaluation of the determining accuracy are presented. This method is also applicable to other nonferroelectric single crystal systems and would benefit the orientation-related issues.
X射线衍射（XRD）技术在确定晶体取向方面有着广泛的应用。在本文中，我们描述了一种基于改进的旋转取向XRD方法来确定铁电单晶三维取向的两步法。该方法可以在标准的X射线实验室设备上轻松实现。考虑到晶体学中的几何关系，我们得到了一个用于找到预期晶面的方程，并简化了确定过程。将该方法应用于LiNbO(3)和xPb(Mg(1/3)Nb(2/3))O(3)-(1-x)PbTiO(3)铁电单晶表明，它是一种用于晶体取向的快速、灵活且无浪费的方法。文中给出了扫描衍射图谱的解释以及确定精度的评估。该方法也适用于其他非铁电单晶系统，并将有益于与取向相关的问题。
