Hertz H M, Byer R L
Opt Lett. 1990 Apr 1;15(7):396-8. doi: 10.1364/ol.15.000396.
The knife-edge technique for measurements of micrometer-sized beams is extended to two-dimensional imaging by tomographic reconstruction of multiangular knife-edge data. Two-dimensional intensity distributions at optical (633-nm) and soft-x-ray (13.5-nm) wavelengths at the focal region of a Schwarzschild objective are presented. The resolution is limited by the 200-nm step size used in the data acquisition.
通过对多角度刀口数据进行断层重建，将用于微米级光束测量的刀口技术扩展到二维成像。给出了施瓦氏物镜焦区在光学（633纳米）和软X射线（13.5纳米）波长下的二维强度分布。分辨率受数据采集中使用的200纳米步长限制。
