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控制上位性 QTL 作图中的假阳性。

Controlling false positives in the mapping of epistatic QTL.

机构信息

Division of Genetics and Genomics, The Roslin Institute and R(D)SVS, University of Edinburgh, Roslin, Midlothian, Scotland EH25 9PS, UK.

出版信息

Heredity (Edinb). 2010 Apr;104(4):401-9. doi: 10.1038/hdy.2009.129. Epub 2009 Sep 30.

Abstract

This study addresses the poorly explored issue of the control of false positive rate (FPR) in the mapping of pair-wise epistatic quantitative trait loci (QTL). A nested test framework was developed to (1) allow pre-identified QTL to be used directly to detect epistasis in one-dimensional genome scans, (2) to detect novel epistatic QTL pairs in two-dimensional genome scans and (3) to derive genome-wide thresholds through permutation and handle multiple testing. We used large-scale simulations to evaluate the performance of both the one- and two-dimensional approaches in mapping different forms and levels of epistasis and to generate profiles of FPR, power and accuracy to inform epistasis mapping studies. We showed that the nested test framework and genome-wide thresholds were essential to control FPR at the 5% level. The one-dimensional approach was generally more powerful than the two-dimensional approach in detecting QTL-associated epistasis and identified nearly all epistatic pairs detected from the two-dimensional approach. However, only the two-dimensional approach could detect epistatic QTL with weak main effects. Combining the two approaches allowed effective mapping of different forms of epistasis, whereas using the nested test framework kept the FPR under control. This approach provides a good search engine for high-throughput epistasis analyses.

摘要

本研究探讨了配对上位数量性状基因座(QTL)作图中假阳性率(FPR)控制这一研究甚少涉及的问题。开发了嵌套测试框架,以(1)允许直接使用预先确定的 QTL 来检测一维基因组扫描中的上位性,(2)在二维基因组扫描中检测新的上位性 QTL 对,以及(3)通过置换得出全基因组阈值并处理多重检验。我们使用大规模模拟来评估一维和二维方法在映射不同形式和水平的上位性方面的性能,并生成 FPR、功效和准确性的概况,为上位性作图研究提供信息。我们表明,嵌套测试框架和全基因组阈值对于将 FPR 控制在 5%水平至关重要。在检测与 QTL 相关的上位性方面,一维方法通常比二维方法更有效,并且几乎可以检测到二维方法检测到的所有上位性对。然而,只有二维方法才能检测到具有较弱主效应的上位性 QTL。结合两种方法可以有效地映射不同形式的上位性,而嵌套测试框架则可以控制 FPR。这种方法为高通量上位性分析提供了一个很好的搜索引擎。

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