扫描隧道显微镜针尖原位处理的支架

Holders for in situ treatments of scanning tunneling microscopy tips.

作者信息

Ishida Nobuyuki, Subagyo Agus, Ikeuchi Akira, Sueoka Kazuhisa

机构信息

Graduate School of Information Science and Technology, Hokkaido University, Kita-14, Nishi-9, Kita-ku, Sapporo 060-0814, Japan.

出版信息

Rev Sci Instrum. 2009 Sep;80(9):093703. doi: 10.1063/1.3223974.

DOI:10.1063/1.3223974

PMID:19791940

Abstract

We have developed holders for scanning tunneling microscopy tips that can be used for in situ treatments of the tips, such as electron bombardment (EB) heating, ion sputtering, and the coating of magnetic materials. The holders can be readily installed into the transfer paths and do not require any special type of base stages. Scanning electron microscopy is used to characterize the tip apex after EB heating. Also, spin-polarized scanning tunneling spectroscopy using an Fe coated W tip on the Cr(001) single crystal surface is performed in order to confirm both the capability of heating a tip up to about 2200 K and the spin sensitivity of the magnetically coated tip.

摘要

我们已经开发出用于扫描隧道显微镜尖端的支架，该支架可用于尖端的原位处理，如电子轰击（EB）加热、离子溅射以及磁性材料涂层。这些支架可以很容易地安装到传输路径中，并且不需要任何特殊类型的基座平台。扫描电子显微镜用于表征EB加热后的尖端顶点。此外，在Cr(001)单晶表面上使用涂有Fe的W尖端进行自旋极化扫描隧道谱，以确认将尖端加热到约2200 K的能力以及磁性涂层尖端的自旋灵敏度。