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具有反铁磁探针尖端的自旋极化扫描隧道显微镜。

Spin-polarized scanning tunneling microscopy with antiferromagnetic probe tips.

作者信息

Kubetzka A, Bode M, Pietzsch O, Wiesendanger R

机构信息

Institute of Applied Physics and Microstructure Research Center, University of Hamburg, Jungiusstrasse 11, D-20355 Hamburg, Germany.

出版信息

Phys Rev Lett. 2002 Feb 4;88(5):057201. doi: 10.1103/PhysRevLett.88.057201. Epub 2002 Jan 18.

Abstract

We have performed low temperature spin-polarized scanning tunneling microscopy (SP-STM) of two monolayers Fe on W(110) using tungsten tips coated with different magnetic materials. We observe stripe domains with a magnetic period of 50 +/- 5 nm. Employing Cr as a coating material we recorded SP-STM images with an antiferromagnetic probe tip. The advantage of its vanishing dipole field is most apparent in external magnetic fields. This new approach resolves the problem of the disturbing influence of a ferromagnetic tip in the investigation of soft magnetic materials and superparamagnetic particles.

摘要

我们使用涂覆有不同磁性材料的钨尖端,对W(110)上的两层铁单分子层进行了低温自旋极化扫描隧道显微镜(SP-STM)研究。我们观察到磁周期为50±5纳米的条纹畴。采用铬作为涂层材料,我们用反铁磁探针尖端记录了SP-STM图像。其偶极场消失的优势在外部磁场中最为明显。这种新方法解决了在软磁材料和超顺磁性颗粒研究中,铁磁尖端产生干扰影响的问题。

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