Department of Chemistry, University of Houston, Houston, Texas 77204, USA.
Langmuir. 2010 May 4;26(9):6167-76. doi: 10.1021/la902404b.
A Langmuir film of a third-generation carbazole-terminated poly(benzyl ether) (G3-CtPBE) dendrimer was investigated at the air-water interface. Langmuir-Blodgett (LB) films were deposited on gold substrates and investigated by atomic force microscopy (AFM), followed by electrochemical and electronanopatterning studies. For the G3-CtPBE dendrimer aggregates, variable concentration and surface pressure gave control over aggregate size and shape at the air-water interface. At a lower concentration C1, aggregate-spherical nanoparticles were observed with a face-on or overlapped orientation with increasing surface pressure. However, at a higher concentration C2, their surface morphologies exhibited circular and rod-shaped aggregates with respect to increasing surface pressure attributed to an edge-on configurational change. Moreover, in situ simultaneous interfacial potentiostatic electrodeposition with LB transfer at the air-water interface was employed for the first time with the G3-CtPBE dendrimers onto a hydrophilic surface under constant voltage (i.e., close to the oxidation potential of G3-CtPBE for electrochemical cross-linking). Electrochemical cross-linking on G3-CtPBE dendrimer LB films was also performed ex situ to investigate electrochemical and optical properties. Finally, as an application of a cross-linkable LB film, electronanolithography was carried out to prepare nanopatterns using the current sensing atomic force microscopy (CS-AFM) technique.
第三代咔唑末端聚（苯醚）（G3-CtPBE）树枝状大分子的 Langmuir 膜在气液界面进行了研究。Langmuir-Blodgett（LB）膜沉积在金基底上，并通过原子力显微镜（AFM）进行了研究，随后进行了电化学和电子纳米图案化研究。对于 G3-CtPBE 树枝状大分子聚集体，可变浓度和表面压力可控制在气液界面处的聚集体大小和形状。在较低浓度 C1 下，随着表面压力的增加，观察到具有面朝上或重叠取向的聚集-球形纳米颗粒。然而，在较高浓度 C2 下，它们的表面形态表现出与表面压力增加有关的圆形和棒状聚集体，这归因于边缘取向的构象变化。此外，首次在气液界面使用 LB 转移，在恒定电压（即接近 G3-CtPBE 电化学交联的氧化电势）下将 G3-CtPBE 树枝状大分子电化学原位共沉积到亲水表面上。还进行了 G3-CtPBE 树枝状大分子 LB 膜的电化学交联实验，以研究电化学和光学性质。最后，作为可交联 LB 膜的应用，进行了电子纳米光刻，使用电流感应原子力显微镜（CS-AFM）技术制备纳米图案。
