Kane D J, Trebino R
Opt Lett. 1993 May 15;18(10):823-5. doi: 10.1364/ol.18.000823.
We introduce a new technique, frequency-resolved optical gating, for measuring the intensity I(t) and the phase ø(t) of an individual arbitrary ultrashort pulse. Using an instantaneous nonlinear-optical interaction of two variably delayed replicas of the pulse, frequency-resolved optical gating involves measuring the spectrum of the signal pulse versus relative delay. The resulting trace, a spectrogram, yields an intuitive full-information display of the pulse. Inversion of this trace to obtain the pulse intensity and phase is equivalent to the well-known two-dimensional phase-retrieval problem and thus yields essentially unambiguous results for I(t) and ø(t).
我们介绍一种用于测量单个任意超短脉冲的强度I(t)和相位ø(t)的新技术——频率分辨光学门控。利用该脉冲两个可变延迟复制品之间的瞬时非线性光学相互作用，频率分辨光学门控涉及测量信号脉冲的光谱与相对延迟的关系。所得的轨迹，即频谱图，可直观地完整显示脉冲信息。将此轨迹进行反演以获得脉冲强度和相位，等同于著名的二维相位恢复问题，因此对于I(t)和ø(t)能得到基本明确的结果。
