Nishii J, Yamanaka H, Hosono H, Kawazoe H
Opt Lett. 1996 Sep 1;21(17):1360-2. doi: 10.1364/ol.21.001360.
GeO(2) - SiO(2) thin glass films were prepared by the rfsputtering deposition method. Changes in the refractive index of -3% and in the volume of +18% were induced in the film by irradiation with excimer-laser pulses. Bragg gratings a (periodic surface-relief pattern with a sinusoidal wave) have been written in the film by irradiation through a phase mask.
