Department of Chemistry, Kansas State University, 213 CBC Building, Manhattan, Kansas 66506-0401, USA.
Langmuir. 2010 Feb 2;26(3):2119-23. doi: 10.1021/la902677e.
This paper reports the surface chemical properties of ca. 20 nm wide domains on a UV-treated thin film of a polystyrene-poly(methyl methacrylate) diblock copolymer (PS-b-PMMA; 0.3 as the PMMA volume fraction). UV irradiation and subsequent acetic acid (AcOH) treatment were used for selectively etching horizontally aligned PMMA domains on a thin PS-b-PMMA film to obtain nanoscale trenches and ridges. The surface charge and hydrophilicity of the trenches (etched PMMA domains) and ridges (PS domains) were investigated using three approaches based on scanning force microscopy. Chemical force titration data with a COOH-terminated tip showed a prominent decrease in adhesion force from pH 3 to 4.5 due to electrostatic repulsion between negatively charged functional groups on the tip and film surface but could not clarify the difference in chemical properties between the two nanoscale domains. Friction force images in n-dodecane showed higher friction over etched PMMA and PS domains with an OH-terminated tip and a CH(3)-terminated tip, respectively, exhibiting higher hydrophilicity of the etched PMMA domains. In an atomic force microscopy image of a UV/AcOH-treated PS-b-PMMA film upon immersion in a ferritin solution, approximately 80% of the ferritin deposited on the film was found on the PS domains. The preferential deposition of ferritin on the PS domains was probably due to the electrostatic repulsion between negatively charged ferritin and negatively charged etched PMMA surface in addition to the hydrophobic interaction between ferritin and the PS surface. These results indicated that the etched PMMA domains were more hydrophilic than the PS domains due to the presence of acidic functional groups (e.g., -COOH groups) at a higher density.
本文报道了经紫外光处理的聚苯乙烯-聚甲基丙烯酸甲酯嵌段共聚物(PS-b-PMMA;PMMA 体积分数为 0.3)薄膜上约 20nm 宽畴的表面化学性质。紫外光辐照和随后的乙酸(AcOH)处理用于选择性地刻蚀 PS-b-PMMA 薄膜上取向排列的 PMMA 畴,以获得纳米级的沟槽和脊。利用基于扫描力显微镜的三种方法研究了沟槽(刻蚀 PMMA 畴)和脊(PS 畴)的表面电荷和润湿性。带有 COOH 端基的针尖的化学力滴定数据表明,由于针尖和薄膜表面上带负电荷的官能团之间的静电排斥,粘附力从 pH3 到 4.5 显著降低,但无法澄清两个纳米畴之间的化学性质差异。在 n-十二烷中,带有 OH 端基的针尖和 CH3 端基的针尖分别显示出刻蚀 PMMA 和 PS 畴的摩擦力图像较高,表明刻蚀 PMMA 畴具有较高的亲水性。在浸入铁蛋白溶液后的 UV/AcOH 处理 PS-b-PMMA 薄膜的原子力显微镜图像中,约 80%的铁蛋白沉积在 PS 畴上。铁蛋白优先沉积在 PS 畴上可能是由于带负电荷的铁蛋白和带负电荷的刻蚀 PMMA 表面之间的静电排斥以及铁蛋白和 PS 表面之间的疏水相互作用。这些结果表明,由于存在更高密度的酸性官能团(例如-COOH 基团),刻蚀 PMMA 畴比 PS 畴更亲水。