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利用原子层沉积技术对光学元件进行化学腐蚀防护。

Chemical corrosion protection of optical components using atomic layer deposition.

作者信息

Du Xiaohua, Zhang Kevin, Holland Kathy, Tombler Thomas, Moskovits Martin

机构信息

NanoOpto, an API Technologies Company, 1600 Cottontail Lane, Somerset, New Jersey 08873, USA.

出版信息

Appl Opt. 2009 Nov 20;48(33):6470-4. doi: 10.1364/AO.48.006470.

Abstract

Very thin films deposited using atomic layer deposition (ALD) on aluminum mirrors showed extraordinary resistance toward concentrated alkali solutions, various chemical etchants, and solvents. Aluminum mirrors with no surface protection dissolved immediately in 24% aqueous KOH. Mirrors protected with 30 nm electron-beam deposited silica film were fully removed in 30 min. Mirrors with 10, 30, and 120 nm films grown by ALD required, respectively, 10, 15, and 60 h of exposure to the alkali for the mirror to be fully removed. Likewise, large-scale hydrogen bubbling was observed immediately upon immersing mirrors coated with electron-beam deposited silica in aqueous KOH, whereas no visible hydrogen bubbling was detected for the mirror protected by ALD silica. For mirrors protected by 120 nm ALD silica, a 2 h soak in various acid and solvent media produced no discernible change.

摘要

使用原子层沉积(ALD)在铝镜上沉积的非常薄的薄膜对浓碱溶液、各种化学蚀刻剂和溶剂表现出非凡的耐受性。没有表面保护的铝镜立即溶解在24%的氢氧化钾水溶液中。用30纳米电子束沉积二氧化硅膜保护的镜子在30分钟内被完全去除。通过ALD生长的具有10、30和120纳米薄膜的镜子分别需要10、15和60小时暴露在碱中才能将镜子完全去除。同样,将涂有电子束沉积二氧化硅的镜子浸入氢氧化钾水溶液中时,立即观察到大量氢气冒泡现象,而对于由ALD二氧化硅保护的镜子则未检测到可见的氢气冒泡现象。对于由120纳米ALD二氧化硅保护的镜子,在各种酸和溶剂介质中浸泡2小时没有产生明显变化。

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