Dobosz S, Stabile H, Tortora A, Monot P, Réau F, Bougeard M, Merdji H, Carré B, Martin Ph, Joyeux D, Phalippou D, Delmotte F, Gautier J, Mercier R
CEA, IRAMIS, Service des Photons Atomes et Molécules, F-91191 Gif- sur-Yvette, France.
Rev Sci Instrum. 2009 Nov;80(11):113102. doi: 10.1063/1.3257676.
We report on an innovative two-dimensional imaging extreme ultraviolet (XUV) interferometer operating at 32 nm based on the mutual coherence of two laser high order harmonics (HOH) sources, separately generated in gas. We give the first evidence that the two mutually coherent HOH sources can be produced in two independent spatially separated gas jets, allowing for probing centimeter-sized objects. A magnification factor of 10 leads to a micron resolution associated with a subpicosecond temporal resolution. Single shot interferograms with a fringe visibility better than 30% are routinely produced. As a test of the XUV interferometer, we measure a maximum electronic density of 3x10(20) cm(-3) 1.1 ns after the creation of a plasma on aluminum target.
我们报道了一种基于在气体中分别产生的两个激光高次谐波（HOH）源的相互相干性、工作在32纳米的创新型二维成像极紫外（XUV）干涉仪。我们首次证明了两个相互相干的HOH源可以在两个独立的、空间分离的气体喷流中产生，从而能够探测厘米尺寸的物体。10倍的放大因子带来了与亚皮秒时间分辨率相关的微米分辨率。常规产生的单次干涉图条纹可见度优于30%。作为对XUV干涉仪的测试，我们在铝靶上产生等离子体1.1纳秒后测量到最大电子密度为3×10²⁰厘米⁻³。
