Department of Physical and Analytical Chemistry, Faculty of Chemistry, University of Oviedo, J. Claveria 8, 33006 Oviedo, Spain.
Anal Bioanal Chem. 2010 Apr;396(8):2833-40. doi: 10.1007/s00216-009-3327-2. Epub 2009 Dec 4.
The development of highly ordered and self-assembled magnetic nanostructures such as arrays of Fe or Ni nanowires and their alloys is arousing increasing interest due to the peculiar magnetic properties of such materials at the nanoscale. These nanostructures can be fabricated using nanoporous anodic alumina membranes or self-assembled nanotubular titanium dioxide as templates. The chemical characterization of the nanostructured layers is of great importance to assist the optimization of the filling procedure or to determine their manufacturing quality. Radiofrequency glow discharge (RF-GD) coupled to optical emission spectrometry (OES) is a powerful tool for the direct analysis of either conducting or insulating materials and to carry out depth profile analysis of thin layers by multi-matrix calibration procedures. Thus, the capability of RF-GD-OES is investigated here for the in-depth quantitative analysis of self-aligned titania nanotubes and self-ordered nanoporous alumina filled with arrays of metallic and magnetic nanowires obtained using the template-assisted filling method. The samples analysed in this work consisted of arrays of Ni nanowires with different lengths (from 1.2 up to 5 microm) and multilayer nanowires of alternating layers with different thicknesses (of 1-2 microm) of Ni and Au, or Au and FeNi alloy, deposited inside the alumina and titania membranes. Results, compared with other techniques such as scanning electron microscopy and energy-dispersive X-ray spectroscopy, show that the RF-GD-OES surface analysis technique proves to be adequate and promising for this challenging application.
由于纳米尺度下这些材料的特殊磁性能,高度有序和自组装的磁性纳米结构(如铁或镍纳米线及其合金的阵列)的发展引起了越来越多的兴趣。这些纳米结构可以使用纳米多孔阳极氧化铝膜或自组装的纳米管状二氧化钛作为模板来制造。纳米结构层的化学特性对于协助填充程序的优化或确定其制造质量非常重要。射频辉光放电 (RF-GD) 结合光发射光谱 (OES) 是直接分析导电或绝缘材料以及通过多矩阵校准程序进行薄膜深度剖面分析的强大工具。因此,这里研究了 RF-GD-OES 对使用模板辅助填充方法获得的自对准二氧化钛纳米管和填充有金属和磁性纳米线阵列的自有序纳米多孔氧化铝的深度定量分析的能力。在这项工作中分析的样品由不同长度(从 1.2 微米到 5 微米)的镍纳米线阵列和不同厚度(1-2 微米)的镍和金或金和铁镍合金交替层的多层纳米线组成,沉积在氧化铝和二氧化钛膜内。与扫描电子显微镜和能量色散 X 射线光谱等其他技术相比,结果表明,RF-GD-OES 表面分析技术对于这一具有挑战性的应用来说是充分和有前途的。