Laboratorio de Electrónica Cuántica, Departamento de Física, Universidad de Buenos Aires, Pabellón I,Ciudad Universitaria, (1428) Buenos Aires, Argentina.
Opt Lett. 2009 Dec 15;34(24):3797-9. doi: 10.1364/OL.34.003797.
We present a novel noncontact, photothermal technique, based on the focus error signal of a commercial CD pickup head that allows direct determination of absorption in thin films. Combined with extinction methods, this technique yields the scattering contribution to the losses. Surface plasmon polaritons are excited using the Kretschmann configuration in thin Au films of varying thickness. By measuring the extinction and absorption simultaneously, it is shown that dielectric constants and thickness retrieval leads to inconsistencies if the model does not account for scattering.
我们提出了一种新颖的非接触光热技术，基于商用 CD 读取头的聚焦误差信号，可以直接确定薄膜的吸收。结合消光方法，该技术可以得到散射对损耗的贡献。在不同厚度的薄金膜中，采用 Kretschmann 配置激发出表面等离子体激元。通过同时测量消光和吸收，结果表明，如果模型不考虑散射，介电常数和厚度的反演会导致不一致。
