NEST-CNR-INFM and Scuola Normale Superiore, Piazza dei Cavalieri 7, I-56127 Pisa, Italy.
Nanotechnology. 2010 Feb 5;21(5):055202. doi: 10.1088/0957-4484/21/5/055202. Epub 2009 Dec 21.
It is known that under a tensile strain of about 2% of the lattice constant, the energy of the bottom conduction state of bulk Ge at the Gamma point falls below the minimum at the L point, leading to a direct gap material. In this paper we investigate how the same condition is realized in tensile strained Ge quantum wells. By means of a tight-binding sp(3)d(5)s(*) model, we study tensile strained Ge/Si(0.2)Ge(0.8) multiple quantum well (MQW) heterostructures grown on a relaxed SiGeSn alloy buffer along the [001] direction. We focus on values of the strain fields at the crossover between the indirect and direct gap regime of the MQWs, and calculate band edge alignments, electronic band structures, and density of states. We also provide a numerical evaluation of the MQW material gain spectra for TE and TM polarization under realistic carrier injection levels, taking into account the leakages related to the occupation of the electronic states at the L point. The analysis of the different orbital contributions to the near-gap states of the complete structure allows us to give a clear interpretation of the numerical results for the strain-dependent TM/TE gain ratio. Our calculations demonstrate the effectiveness of the structures under consideration for light amplification.
已知在晶格常数的拉伸应变为约 2%的情况下,Γ点处体锗的底部传导态的能量低于 L 点处的最小值,导致直接带隙材料。在本文中,我们研究了在拉伸应变的 Ge 量子阱中如何实现相同的条件。通过紧束缚 sp(3)d(5)s(*)模型,我们研究了沿[001]方向生长在弛豫 SiGeSn 合金缓冲层上的拉伸应变 Ge/Si(0.2)Ge(0.8)多量子阱(MQW)异质结构。我们关注的是 MQW 间接带和直接带隙之间的交叉处应变场的值,并计算了能带边缘排列、电子能带结构和态密度。我们还根据实际的载流子注入水平,对 TE 和 TM 两种偏振下的 MQW 材料增益谱进行了数值评估,考虑了与 L 点电子态占据相关的泄漏。对完整结构近带隙态的不同轨道贡献的分析,使我们能够对 TM/TE 增益比的应变依赖性的数值结果给出清晰的解释。我们的计算表明,所考虑的结构在光放大方面的有效性。