Paepen J, Altzitzoglou T, Van Ammel R, Sibbens G, Pommé S
European Commission, Joint Research Centre, Institute for Reference Materials and Measurements, Geel, Belgium.
Appl Radiat Isot. 2010 Jul-Aug;68(7-8):1555-60; discussion 1560. doi: 10.1016/j.apradiso.2009.11.050. Epub 2009 Dec 3.
The half-life of (124)Sb was determined experimentally by following the decay of a source from a radiopure solution with a Centronic IG12 ionisation chamber. Thousands of measurements were performed over a period of 358 days, i.e. about six half-life periods. However, the data analysis was restricted to the first 221 days, in order to limit the dominant uncertainty component associated with the hypothetical possibility of a systematic error on background subtraction. The resulting value for the (124)Sb half-life, 60.212 (11) days, is found to be in very good agreement with published values, but carries a lower uncertainty. Major uncertainty contributions pertain to possible systematic errors in background correction, long-term changes in source-detector geometry and medium- and long-term instability of the instrument. Additional measurements were performed with a high-purity germanium detector to confirm the above value.
通过使用Centronic IG12电离室跟踪来自放射纯溶液的源的衰变，对（124）Sb的半衰期进行了实验测定。在358天的时间内进行了数千次测量，即大约六个半衰期。然而，数据分析仅限于前221天，以限制与背景扣除系统误差的假设可能性相关的主要不确定度分量。（124）Sb半衰期的最终值为60.212（11）天，与已发表的值非常吻合，但不确定度较低。主要的不确定度贡献来自背景校正中可能的系统误差、源探测器几何形状的长期变化以及仪器的中长期不稳定性。使用高纯锗探测器进行了额外的测量以确认上述值。
