Sollid J E
Appl Opt. 1969 Aug 1;8(8):1587-95. doi: 10.1364/AO.8.001587.
A general relation is derived by which small displacements of a diffusely reflecting surface may be determined using holographic interferometry. It is shown how a single hologram method of analysis, utilizing parallax and fringe counting, and a multiple hologram method, using interference order assignment are related. Both methods may be viewed in a unified manner. The requirements for application of both methods are discussed.
推导了一个通用关系式，利用该关系式可通过全息干涉测量法确定漫反射表面的微小位移。展示了如何将利用视差和条纹计数的单全息图分析方法与使用干涉级分配的多全息图方法联系起来。这两种方法都可以以统一的方式看待。讨论了这两种方法的应用要求。
