Kruegle H A, Dolin S A
Appl Opt. 1969 Oct 1;8(10):2107-15. doi: 10.1364/AO.8.002107.
A spectrometer has been built which scans from 2000 A 15 micro in 3 sec, and which scans subdivisions to of that range up to 160 times/sec. Four plane reflectance gratings and six detectors are used to cover the range. The first-order spectrum of each grating is scanned by sweeping a sequence of corner mirrors through the intermediate focal plane of a double pass grating monochromator. The four gratings are mounted on a turret, driven by a stepper motor. Between scans, the turret rotates to change gratings,and the appropriate filters and detectors are simultaneously selected automatically. The turret can be stopped and any of the four grating ranges can be scanned 160 times/sec. Absorption spectra and emission spectra of hot samples can be measured alternately. The measured resolution at 3125 A is better than 6 A, and at 3.3 microm better than 0.011 microm.
已制造出一台光谱仪，它能在3秒内从2000埃扫描到15微米，并能以高达每秒160次的速度对该范围的细分区域进行扫描。使用四个平面反射光栅和六个探测器来覆盖该范围。通过将一系列角镜扫过双程光栅单色仪的中间焦平面来扫描每个光栅的一级光谱。四个光栅安装在一个转塔上，由步进电机驱动。在扫描之间，转塔旋转以更换光栅，同时自动选择合适的滤光片和探测器。转塔可以停止，并且四个光栅范围中的任何一个都可以以每秒160次的速度进行扫描。热样品的吸收光谱和发射光谱可以交替测量。在3125埃处测得的分辨率优于6埃，在3.3微米处优于0.011微米。
