Kelsall D
Appl Opt. 1970 Jan 1;9(1):85-90. doi: 10.1364/AO.9.000085.
A high precision method for measuring the specular reflectivity of mirrors at 10.6 micro with a CO(2) laser source when the reflectivity of the mirror approaches close to unity is described. The results of measurements on a range of evaporated thin film coatings are reported. Measurements at other wavelengths using a helium-neon laser have also been made, and this is discussed.
描述了一种高精度方法,用于在镜面反射率接近1时,使用二氧化碳激光源测量10.6微米波长下镜子的镜面反射率。报告了一系列蒸发薄膜涂层的测量结果。还进行了使用氦氖激光在其他波长下的测量,并对此进行了讨论。