Iowa State University, USA.
Ultramicroscopy. 2010 Feb;110(3):254-8. doi: 10.1016/j.ultramic.2009.12.003. Epub 2009 Dec 22.
The atomic force microscope (AFM) is widely used for studying the surface morphology and growth of live cells. There are relatively fewer reports on the AFM imaging of yeast cells [1] (Kasas and Ikai, 1995), [2] (Gad and Ikai, 1995). Yeasts have thick and mechanically strong cell walls and are therefore difficult to attach to a solid substrate. In this report, a new immobilization technique for the height mode imaging of living yeast cells in solid media using AFM is presented. The proposed technique allows the cell surface to be almost completely exposed to the environment and studied using AFM. Apart from the new immobilization protocol, for the first time, height mode imaging of live yeast cell surface in intermittent contact mode is presented in this report. Stable and reproducible imaging over a 10-h time span is observed. A significant improvement in operational stability will facilitate the investigation of growth patterns and surface patterns of yeast cells.
原子力显微镜（AFM）广泛用于研究活细胞的表面形态和生长。关于酵母细胞的 AFM 成像，相关报道相对较少[1]（Kasas 和 Ikai，1995），[2]（Gad 和 Ikai，1995）。酵母具有厚实且机械强度高的细胞壁，因此难以附着在固体基质上。在本报告中，提出了一种用于在固体介质中使用 AFM 对活酵母细胞进行高度模式成像的新型固定化技术。该技术允许细胞表面几乎完全暴露于环境中，并使用 AFM 进行研究。除了新的固定化方案外，本报告首次展示了在间歇接触模式下对活酵母细胞表面的高度模式成像。在 10 小时的时间跨度内观察到稳定且可重复的成像。操作稳定性的显著提高将有助于研究酵母细胞的生长模式和表面模式。
