Rigrod W W, Skelly G
Appl Opt. 1971 Feb 1;10(2):311-6. doi: 10.1364/AO.10.000311.
In multilayer dielectric mirrors with one or more high reflectance bands in the near-ir and visible regions, large anomalous reflection peaks usually appear in the passbands. Their origin is traced to layer thickness inequality caused by unequal dispersions of the high and low index materials, and the common practice of monitoring layer thicknesses at stop bands. A procedure is described which takes account of the variations in materials dispersion in different coating laboratories, suppresses the anomalous reflection peaks, and locates the high reflection bands at their required wavelengths, with a relatively simple monitoring procedure.
在近红外和可见光区域具有一个或多个高反射率带的多层介质镜中，通带中通常会出现大的异常反射峰。其起源可追溯到由高折射率和低折射率材料的色散不均导致的层厚不均，以及在阻带监测层厚的常见做法。本文描述了一种方法，该方法考虑了不同镀膜实验室中材料色散的变化，抑制了异常反射峰，并通过相对简单的监测程序将高反射带定位在所需波长处。
