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化学剥离法制备的氮化硼片的原子分辨率成像和形貌。

Atomic resolution imaging and topography of boron nitride sheets produced by chemical exfoliation.

机构信息

Department of Materials, University of Oxford, Parks Rd, Oxford OX13PH, United Kingdom.

出版信息

ACS Nano. 2010 Mar 23;4(3):1299-304. doi: 10.1021/nn901648q.

DOI:10.1021/nn901648q
PMID:20148574
Abstract

Here, we present a simple method for preparing thin few-layer sheets of hexagonal BN with micrometer-sized dimensions using chemical exfoliation in the solvent 1,2-dichloroethane. The atomic structure of both few-layer and monolayer BN sheets is directly imaged using aberration-corrected high-resolution transmission electron microscopy. Electron beam induced sputtering effects are examined in real time. The removal of layers of BN by electron beam irradiation leads to the exposure of a step edge between a monolayer and bilayer region. We use HRTEM imaging combined with image simulations to show that BN bilayers can have AB stacking and are not limited to just AA stacking.

摘要

在这里,我们提出了一种在 1,2-二氯乙烷溶剂中通过化学剥落制备具有微米尺寸的薄少层六方 BN 的简单方法。使用校正像差的高分辨率透射电子显微镜直接对少层和单层 BN 片的原子结构进行成像。实时检查电子束诱导溅射效应。通过电子束辐照去除 BN 的层,导致在单层和双层区域之间暴露出一个阶梯边缘。我们使用 HRTEM 成像结合图像模拟表明 BN 双层可以具有 AB 堆叠,而不仅仅局限于 AA 堆叠。

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