Li Wei, Webster Scott E, Kumaran Raveen, Penson Shawn, Tiedje Thomas
Advanced Materials and Process Engineering Laboratory, University of British Columbia, Vancouver, British Columbia V6T 1Z4, Canada.
Appl Opt. 2010 Feb 1;49(4):586-91. doi: 10.1364/AO.49.000586.
Optical wave propagation in neodymium-doped yttrium oxide (Nd:Y(2)O(3)) films grown on R-plane sapphire substrates by molecular beam epitaxy has been studied by the prism coupler method. The measurements yield propagation loss data, the refractive index, and the dispersion relation. The refractive index of the Nd:Y(2)O(3) at 632.8 nm is found to be 1.909, and the lowest propagation loss measured is 0.9 +/- 0.2 cm(-1) at 1046 nm with a polymethyl methacrylate top cladding layer on a film with 6 nm root mean square surface roughness. The loss measurements suggest that the majority loss of this planar waveguide sample is scatter from surface roughness that can be described by the model of Payne and Lacey [Opt. Quantum Electron. 26, 977 (1994)].
通过棱镜耦合器方法研究了分子束外延生长在R面蓝宝石衬底上的掺钕氧化钇（Nd:Y₂O₃）薄膜中的光波传播。测量得到了传播损耗数据、折射率和色散关系。发现Nd:Y₂O₃在632.8 nm处的折射率为1.909，在具有6 nm均方根表面粗糙度的薄膜上，在1046 nm处测量到的最低传播损耗为0.9±0.2 cm⁻¹，顶部包层为聚甲基丙烯酸甲酯。损耗测量表明，该平面波导样品的主要损耗是由表面粗糙度引起的散射，这可以用Payne和Lacey的模型[Opt. Quantum Electron. 26, 977 (1994)]来描述。
