Boyd J T
Appl Opt. 1972 Nov 1;11(11):2635-8. doi: 10.1364/AO.11.002635.
Thin-film optical cavities formed by optical waveguides in which end faces are parallel, optically smooth, and perpendicular to waveguide surfaces are analyzed for the possibility of total internal reflection of waveguide mode ray components at the end faces. Conditions for the occurrence of this phenomena in various modes are derived and evaluated for GaAs waveguides using dispersion relations. A refractive index difference between waveguide and surrounding media of at least 4% for GaAs is necessary before total reflection at the end faces can occur. is nearly always expected. For such differences, total reflection in single mode GaAs waveguide is nearly always expected.
对由光波导形成的薄膜光学腔进行了分析，这些光波导的端面是平行的、光学光滑的且垂直于波导表面，以研究波导模式光线分量在端面发生全内反射的可能性。利用色散关系推导并评估了在各种模式下出现这种现象的条件，针对砷化镓波导进行了分析。对于砷化镓波导，在端面能够发生全反射之前，波导与周围介质之间的折射率差至少需要4%。对于这样的折射率差，在单模砷化镓波导中几乎总是预期会发生全反射。
