School of Science, Xi'an Jiaotong University, Xi'an 710049, China.
Opt Lett. 2010 Feb 1;35(3):366-8. doi: 10.1364/OL.35.000366.
We present a mathematical method used to determine the spectrum detected by a birefringence interference imaging spectrometer (BIIS). The reconstructed spectrum has good precision over a wide spectral range, 0.4-1.0 microm. This method considers the light intensity as a function of wavelength and avoids the fatal error caused by birefringence effect in the conventional Fourier transform method. The experimental interferogram of the BIIS is processed in this new way, and the interference data and reconstructed spectrum are in good agreement, proving this method to be very exact and useful. Application of this method will greatly improve the instrument performance.
我们提出了一种用于确定双折射干涉成像光谱仪（BIIS）检测到的光谱的数学方法。在 0.4-1.0 微米的宽光谱范围内，重建光谱具有很好的精度。该方法将光强视为波长的函数，避免了传统傅里叶变换方法中双折射效应引起的致命误差。用这种新方法处理 BIIS 的实验干涉图，干涉数据和重建光谱吻合较好，证明该方法非常精确和有用。这种方法的应用将大大提高仪器的性能。
