Sawatari T
Appl Opt. 1973 Nov 1;12(11):2768-72. doi: 10.1364/AO.12.002768.
A new optical heterodyne scanning microscope is described in which both the illumination beam and reference beam scan the object in synchronization. Characteristics of the microscope are similar to those of the laser scanning microscope. The present system, however, has additional advantages in that the object illumination can be at least one order of magnitude less intense and that ambient light has no effect for images. Preliminary experimental results will be shown, including a two-dimensional cross-section pattern from a 3-D object, unfocused image rejection characteristics, and images of some biological samples.
本文描述了一种新型光学外差扫描显微镜，其中照明光束和参考光束同步扫描物体。该显微镜的特性与激光扫描显微镜相似。然而，本系统具有额外的优点，即物体照明强度至少可低一个数量级，并且环境光对图像没有影响。将展示初步实验结果，包括三维物体的二维横截面图案、离焦图像抑制特性以及一些生物样品的图像。
