Kumar S, Paresce F, Bowyer S, Lampton M
Appl Opt. 1974 Mar 1;13(3):575-80. doi: 10.1364/AO.13.000575.
A normal incidence spectrometer for use in the wavelength region from 200 A to 1270 A has been developed. The design and calibration of the instrument are described in detail. The spectrometer can be employed to detect extreme uv radiation at a minimum flux level of 1 rayleigh with a spectral resolution of 40 A and a spatial resolution of 6 degrees . Data on the extreme uv night sky spectrum between 780 A and 1270 A obtained with this instrument on a recent rocket flight are presented.
已研制出一种用于200埃至1270埃波长范围的垂直入射光谱仪。详细描述了该仪器的设计和校准。该光谱仪可用于探测极紫外辐射，其最小通量水平为1瑞利，光谱分辨率为40埃，空间分辨率为6度。给出了用该仪器在最近一次火箭飞行中获得的780埃至1270埃之间极紫外夜空光谱的数据。
