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通过仅强度角散射来确定均匀球形颗粒的尺寸。

Sizing homogeneous spherical particles from intensity-only angular scatter.

作者信息

Li Wei, Jaffe Jules S

机构信息

Wuhan National Laboratory for Optoelectronics, College of Optoelectronic Science and Engineering, Huazhong University of Science and Technology, Wuhan 430074, China.

出版信息

J Opt Soc Am A Opt Image Sci Vis. 2010 Feb 1;27(2):151-8. doi: 10.1364/JOSAA.27.000151.

DOI:10.1364/JOSAA.27.000151
PMID:20126224
Abstract

A set of algorithms is proposed to retrieve the size of spherically symmetric particles from the measured intensity of angular scatter data. Of special interest are low-contrast particles whose real part of the index of refraction is between 1.03 and 1.09 and whose size ka is constrained so that pi < or = ka < or = 16pi, where k=2pi/lambda and a is particle radius. Several algorithms are evaluated and compared that are based on either simple matching to the Mie theory predictions or inverse tomography methods. In the tomography methods, a previously proposed algorithm [Opt. Express. 15, 12217 (2007)] was used after estimating the phase of the scattered data or adapted to use intensity-only data. In order to ensure stability, all algorithms' performance was evaluated in the presence of moderate noise. The performance varied as a function of particle size, refractive index, and algorithm. Results suggest that a scattering device that collects only the angular scatter that is perpendicular to the polarization of incident light, usually denoted as S(1), can be used to accurately estimate the size of homogeneous, low-contrast, spherical particles whose diameters are close to the wavelength of the incident light.

摘要

提出了一组算法,用于根据测量的角散射数据强度来反演球对称颗粒的尺寸。特别感兴趣的是低对比度颗粒,其折射率的实部在1.03至1.09之间,并且其尺寸ka受到限制,使得π≤ka≤16π,其中k = 2π/λ,a为颗粒半径。对几种基于与米氏理论预测进行简单匹配或逆断层扫描方法的算法进行了评估和比较。在断层扫描方法中,在估计散射数据的相位之后使用先前提出的算法[Opt. Express. 15, 12217 (2007)],或者对其进行调整以仅使用强度数据。为了确保稳定性,在存在中等噪声的情况下评估了所有算法的性能。性能随颗粒尺寸、折射率和算法而变化。结果表明,一种仅收集垂直于入射光偏振的角散射(通常表示为S(1))的散射装置,可用于准确估计直径接近入射光波长的均匀、低对比度球形颗粒的尺寸。

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