Birnbaum G, Cory E, Gow K
Appl Opt. 1974 Jul 1;13(7):1660-9. doi: 10.1364/AO.13.001660.
A sensitive apparatus utilizing a scanning Fabry-Perot interferometer excited by circularly polarized laser radiation is developed for measuring birefringence. A birefringent sample within the interferometer produces a difference in the resonance length for radiation polarized in two orthogonal directions. A Kerr cell properly oriented within the interferometer is used to cancel sample birefringence by adjusting the cell voltage. This adjustment is made by using the scanning interferometer as a spectrum analyzer and observing the displacement between the resonance curves associated with each polarization. The Kerr cell is calibrated in terms of the voltage required to produce a relative path retardation of lambda/2. The stress-induced birefringence in YAG, sapphire, and fused silica in the 26-75 degrees C temperature range is measured, and the accuracy and sensitivity of the instrument are assessed.
开发了一种利用由圆偏振激光辐射激发的扫描法布里-珀罗干涉仪的灵敏装置来测量双折射。干涉仪内的双折射样品会使两个正交方向偏振的辐射的共振长度产生差异。在干涉仪内正确定向的克尔盒用于通过调节盒电压来消除样品双折射。这种调节是通过将扫描干涉仪用作光谱分析仪并观察与每种偏振相关的共振曲线之间的位移来进行的。克尔盒根据产生λ/2相对光程延迟所需的电压进行校准。测量了YAG、蓝宝石和熔融石英在26 - 75摄氏度温度范围内的应力诱导双折射，并评估了该仪器的准确性和灵敏度。
