Stobie R W, Rao B, Dignam M J
Appl Opt. 1975 Apr 1;14(4):999-1003. doi: 10.1364/AO.14.000999.
An automated ir ellipsometer for measurements of the optical properties of thin adsorbed films is described. The instrument makes use of two stationary polarizers that bracket a rotating polarizer and the reflecting surface. This combination introduces modulation in the transmitted light intensity at twice and four times the frequency of rotation of the polarizer. The phases of these two frequency components are then measured in digital form relative to signals derived from the rotating device, the entire instrument being under automatic data acquisition control. A result for an ir ellipsometric study of formic acid chemisorbed on silver is presented.
描述了一种用于测量吸附薄膜光学性质的自动红外椭圆偏振仪。该仪器利用两个固定偏振器，它们夹着一个旋转偏振器和反射表面。这种组合在透射光强度中引入了频率为偏振器旋转频率两倍和四倍的调制。然后，相对于从旋转装置导出的信号，以数字形式测量这两个频率分量的相位，整个仪器处于自动数据采集控制之下。给出了甲酸化学吸附在银上的红外椭圆偏振研究结果。
