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使用光学相干断层扫描技术同时测量光学样品的群折射率和厚度

Simultaneous measurement of group refractive index and thickness of optical samples using optical coherence tomography.

作者信息

Cheng Hsu-Chih, Liu Yi-Cheng

机构信息

Department of Electro-Optics Engineering, National Formosa University, Yunlin, Taiwan.

出版信息

Appl Opt. 2010 Feb 10;49(5):790-7. doi: 10.1364/AO.49.000790.

Abstract

Optical coherence tomography (OCT), based on a Michelson interferometer and utilizing low coherence light as the optical source, is a novel technique for the noninvasive imaging of optical scattering media. A simple OCT scheme based on a 3 x 3 fiber coupler is presented for the simultaneous measurement of the refractive index and thickness of optical samples. The proposed system enables the refractive index and thickness to be determined without any prior knowledge of the sample parameters and is characterized by a simple and compact configuration, a straightforward measurement procedure, and a low cost. The feasibility of the proposed approach is demonstrated experimentally using BK7 and B270 optical glass samples.

摘要

光学相干断层扫描(OCT)基于迈克尔逊干涉仪,利用低相干光作为光源,是一种用于光学散射介质无创成像的新技术。本文提出了一种基于3×3光纤耦合器的简单OCT方案,用于同时测量光学样品的折射率和厚度。该系统无需事先了解样品参数即可确定折射率和厚度,具有结构简单紧凑、测量过程直接、成本低的特点。利用BK7和B270光学玻璃样品通过实验证明了该方法的可行性。

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