回复 Maurice 等人对“电子背散射衍射分析的布拉格定律衍射模拟”的评论。
Reply to comment by Maurice et al. in response to "Bragg's Law Diffraction Simulations for Electron Backscatter Diffraction Analysis".
机构信息
Brigham Young University, 2520B Leeper Dr, Champaign, IL 61822, USA.
出版信息
Ultramicroscopy. 2010 Jun;110(7):741-3. doi: 10.1016/j.ultramic.2010.02.004. Epub 2010 Feb 20.
Abstract
A reply to Maurice et al.'s comment on "Bragg's Law Diffraction Simulations for Electron Backscatter Diffraction" is presented. A new method for microscope geometry calibration is briefly presented. Also, evidence that simple diffraction simulations can be profitable tools for absolute elastic strain measurements in crystalline materials is reiterated.
摘要
现回复 Maurice 等人对“Bragg 定律在电子背散射衍射中的衍射模拟”一文的评论。文中简要介绍了一种新的显微镜几何校准方法。同时，文中还重申了简单的衍射模拟可以成为晶体材料中绝对弹性应变测量的有用工具这一观点。
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