School of Mechanical and Electronic Engineering, Harbin Institute of Technology, Harbin, China.
Ultramicroscopy. 2010 May;110(6):592-5. doi: 10.1016/j.ultramic.2010.02.016. Epub 2010 Feb 23.
The accuracy of topography imaging in contact force mode of atomic force microscopy (AFM) depends on the one-to-one corresponding relationship between the cantilever deflection and the tip-sample distance, whereas such a relationship cannot be always achieved in the presence of friction and incline angle of sample surface. Recently, we have developed a novel operation mode in which we keep the van der Waals force as constant instead of the applied normal force, to eliminate the effect of inclination angle and friction on topography imaging in the contact force mode. We have improved our AFM to enable the new operation mode for validation. Comparative experiments have been performed and the results have shown that the effect of friction and inclination angle on topography imaging in contact mode of AFM can be eliminated or at least decreased effectively by working in the new operation mode we present.
原子力显微镜（AFM）接触力模式下的形貌成像精度取决于悬臂梁挠度与针尖-样品距离之间的一一对应关系，但在存在摩擦力和样品表面倾斜角的情况下，这种关系并不总是能够实现。最近，我们开发了一种新的操作模式，我们保持范德华力为常数，而不是施加的法向力，以消除倾斜角和摩擦力对接触力模式下形貌成像的影响。我们已经改进了我们的 AFM 以启用新的操作模式进行验证。已经进行了比较实验，结果表明，通过在我们提出的新操作模式下工作，可以有效消除或至少减小 AFM 接触模式下摩擦力和倾斜角对形貌成像的影响。
