Kowalik W
Appl Opt. 1978 Sep 15;17(18):2956-66. doi: 10.1364/AO.17.002956.
A measuring method is described which is not limited by interferometer errors. Variations in the geometrical and optical thickness of the block under investigation and its refractive index may be measured by means of scanning three interferograms and using computer analysis. There also exists a possibility of calculating the rate of variation of these quantities according to coordinate alteration of the investigated block. Some measurement results are given, and analysis of measuring accuracy is carried out. Measuring accuracy for refractive index difference distribution may reach one part in 1 x 10(-7) for centimeter thick samples.
描述了一种不受干涉仪误差限制的测量方法。通过扫描三张干涉图并利用计算机分析，可以测量被研究块体的几何厚度、光学厚度及其折射率的变化。根据被研究块体的坐标变化，还有可能计算这些量的变化率。给出了一些测量结果，并对测量精度进行了分析。对于厘米厚的样品，折射率差分布的测量精度可达1×10^(-7)分之一。
