Shumate M S
California Institute of Technology, JetPropulsion Laboratory, Pasadena, California, USA.
Appl Opt. 1966 Feb 1;5(2):327-31. doi: 10.1364/AO.5.000327.
A method for determination of refractive indices which may be applied to thin flat plates of optical materials is considered. It is particularly suited for use with materials whose refractive indices are large (>1.8), but is not limited in the range of refractive index it can determine. The method uses an interferometer to measure the optical pathlength through a sample, and is shown to have moderate accuracy: +/-2 x 10(-4) in refractive index for a sample 0.5 mm thick. The effect of a nonideal sample is considered, and is shown to have only a small effect on the accuracy. The method has been applied to singlecrystal barium titanate in the visible spectrum, and tabulated results are given.
本文考虑了一种可用于测定光学材料薄平板折射率的方法。该方法特别适用于折射率较大（>1.8）的材料，但在其可测定的折射率范围内并无限制。此方法利用干涉仪测量穿过样品的光程长度，结果表明其具有中等精度：对于厚度为0.5毫米的样品，折射率测量精度为±2×10⁻⁴。文中考虑了非理想样品的影响，结果表明其对精度的影响很小。该方法已应用于可见光谱范围内的单晶钛酸钡，并给出了列表结果。
