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用红外光谱法研究 SiO 和 SiO2 的蒸发和冷凝。

Evaporation and condensation of SiO and SiO2 studied by infrared spectroscopy.

机构信息

Kirchhoff Institute for Physics, Im Neuenheimer Feld 227, 69120 Heidelberg, Germany.

出版信息

Appl Spectrosc. 2010 Mar;64(3):298-303. doi: 10.1366/000370210790918346.

DOI:10.1366/000370210790918346
PMID:20223065
Abstract

Physical evaporation of SiO and SiO(2) under ultra-high vacuum conditions was monitored in situ with infrared spectroscopy at frequencies between 450 cm(-1) and 5000 cm(-1). The measured vibrational spectra of the condensed films are identical in both cases, for SiO and SiO(2) evaporation, and can be described with four Brendel oscillators located at 380 cm(-1), 713 cm(-1), 982 cm(-1), and 1101 cm(-1), corresponding to typical vibration modes in SiO.

摘要

采用红外光谱法在超高真空条件下对 SiO 和 SiO(2)的物理蒸发进行了实时监测，测量频率范围为 450 cm(-1) 至 5000 cm(-1)。在 SiO 和 SiO(2)蒸发的情况下，所测量的凝聚膜的振动光谱在两种情况下都是相同的，并且可以用四个 Brendel 振荡器来描述，它们位于 380 cm(-1)、713 cm(-1)、982 cm(-1)和 1101 cm(-1)，对应于 SiO 中的典型振动模式。

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