Sommargren G E
Appl Opt. 1981 Feb 15;20(4):610-8. doi: 10.1364/AO.20.000610.
A noncontact optical technique for the measurement of surface profile is described, which has a height sensitivity of the order of 1 A. It is based on a common path heterodyne interferometer in which two orthogonally polarized beams of slightly different frequency are focused on the surface to be measured. One focal point acts as a reference as the other point circularly scans the surface. The phase of the beat frequency of the interfering return beams is directly proportional to the surface height. The results of a surface measurement include graphical displays of the surface profile, autocovariance function, spectral density function, stability, and repeatability. Comparison with other instruments is also discussed.
本文描述了一种用于测量表面轮廓的非接触式光学技术,其高度灵敏度约为1埃。该技术基于一种共光路外差干涉仪,其中两束频率略有不同的正交偏振光束聚焦在待测表面上。一个焦点作为参考,另一个焦点对表面进行圆周扫描。干涉回波光束的拍频相位与表面高度成正比。表面测量结果包括表面轮廓的图形显示、自协方差函数、谱密度函数、稳定性和重复性。还讨论了与其他仪器的比较。