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在力-距离和摩擦模式下,使用原子力显微镜测量二碲化钨(WTe₂)上的各向异性摩擦。

Measuring anisotropic friction on WTe2 using atomic force microscopy in the force-distance and friction modes.

作者信息

Watson Gregory S, Myhra Sverre, Watson Jolanta A

机构信息

School of Pharmacy and Molecular Sciences, James Cook University, Townsville, OLD 4811, Australia.

出版信息

J Nanosci Nanotechnol. 2010 Apr;10(4):2463-72. doi: 10.1166/jnn.2010.1400.

DOI:10.1166/jnn.2010.1400
PMID:20355449
Abstract

Layered materials which can be easily cleaved have proved to be excellent samples for the study of atomic scale friction. The layered transition metal dichalcogenides have been particularly popular. These materials exhibit a number of interesting properties ranging from superconductivity to low frictional coefficients. In this paper we have investigated the tribology of the dichalcogenide-WTe2. The coefficient of friction is less than 0.040 along the Te rows and increases to over 0.045 across the rows. The frictional forces almost doubled at normal loads of 5000 nN when scanning in the [010] direction in comparison to the [100] direction. The frictional responses of the AFM probe have been monitored in the frictional force and force-versus-distance (f-d) mode. A comparison between the outcomes using the two different modes demonstrates the factors which need to be considered for accurate measurements.

摘要

易于解理的层状材料已被证明是研究原子尺度摩擦的优秀样本。层状过渡金属二硫属化物尤其受欢迎。这些材料展现出许多有趣的特性,从超导性到低摩擦系数。在本文中,我们研究了二硫属化物-WTe2的摩擦学。沿着碲行的摩擦系数小于0.040,跨行时增加到超过0.045。与[100]方向相比,在[010]方向扫描时,在5000 nN的法向载荷下摩擦力几乎翻倍。已在摩擦力和力-距离(f-d)模式下监测了原子力显微镜(AFM)探针的摩擦响应。使用两种不同模式的结果比较表明了进行精确测量时需要考虑的因素。

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